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ADF7021-N TEST PATTERN GENERATOR

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When using the following setting modulation+test patterns on the ADF7021-N (EVAL-ADF7021-NDB),

I get the incorrect frequency, or not change setting frequency.

Does the combination of Modulation+Test patterns generater include a limit?
Is this expected?

Modulation+Test pattern

1.RC2FSK+Transmit Carrier
2.RC2FSK+ransmit + fDEV Tone
3.RC2FSK+ransmit − fDEV Tone


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